A Quality Perspective of Evolvability Using Semantic Analysis

Abstract

Software development and maintenance are highly distributed processes that involve a multitude of supporting tools and resources. Knowledge relevant to these resources is typically dispersed over a wide range of artifacts, representation formats, and abstraction levels. In order to stay competitive, organizations are often required to assess and provide evidence that their software meets the expected requirements. In our research, we focus on assessing non-functional quality requirements, specifically evolvability, through semantic modeling of relevant software artifacts. We introduce our SE-Advisor that supports the integration of knowledge resources typically found in software ecosystems by providing a unified ontological representation. We further illustrate how our SE-Advisor takes advantage of this unified representation to support the analysis and assessment of different types of quality attributes related to the evolvability of software ecosystems.

Reference

Philipp Schugerl, Juergen Rilling, René Witte, and Philippe Charland. A Quality Perspective of Evolvability Using Semantic Analysis. Third IEEE International Conference on Semantic Computing (ICSC 2009), pp. 420–427, September 14–16, 2009, Berkeley, CA, USA. (Acceptance rate: 30%)

Bibtex entry (also for download):

@inproceedings{icsc2009,
  author = {Schugerl, Philipp and Rilling, Juergen and Witte, Ren\'{e} and Charland, Philippe},
  title = {{A Quality Perspective of Software Evolvability Using Semantic Analysis}},
  booktitle = {Third IEEE International Conference on Semantic Computing (ICSC 2009)},
  year = {2009},
  month = {September 14--16},
  pages = {420--427},
  isbn = {978-0-7695-3800-6},
  doi = {http://dx.doi.org/10.1109/ICSC.2009.10},
  publisher = {IEEE Computer Society},
  address = {Berkeley, CA, USA},
  url= {http://rene-witte.net/evolvability-icsc2009}
}

Download

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Local copy: evolvability-icsc09.pdf
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Copyright © 2009 IEEE. It is posted here by permission of IEEE for your personal use. Not for redistribution. DOI: 10.1109/ICSC.2009.10